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PK40X-… S High purity pressure sensor

  • Seal: Special pressure process connection with semiconductor
  • Test: 100% helium leak test
  • Packing: Vacuum packing in clean room
  • Surface treatment: EP level Ra≤0.13µm at the process connection

 

Application

  • Photovoltaic semiconductor
  • High purity/ultra-pure application environment
  • Corrosive liquid gas environment
  • Valve system

This product is all-metal welded structure, can choose semiconductor photovoltaic special pressure joint, liquid surface 100% special EP treatment, and degreasing oil free cleaning, fully meet the semiconductor, photovoltaic, flat panel display, high purity/ultra-pure environment, special gas pipeline and other applications.

● The pressure range covers -14.7~5000psi, and the range can be selected to meet the special requirements of customers.
● 100% leakage test of product production to meet the sealing requirements of the industry, to avoid the risk of flammable and explosive, corrosion or toxic media overflow.

The product is produced in a 100-level clean room and vacuum-packed while 100% cleaned to meet the requirements of SEMI standards.

 

Technical parameter

Type Gauge, Absolute, Negative Pressure
Measurement Range  -14.7…0…5000psi
Accuracy Grade (@25℃) ≥160psi: ±0.1%FS BFSL;           <160psi: ±0.15%FS BFSL
Maximum Measurement Deviation (@25℃)  ±0.25%FS
Overpressure  Up to 4 times maximum
Medium Temperature  -20…85°C
Ambient Temperature  -40…125°C
Average Temperature Coefficient (-20~85℃)  Zero point: <0.1%FS/10K;    Span: <0.1%FS/10K
Supply Voltage  DC24V (10…30V DC)
Output Signal  4…20mA, 0…5V, 0…10V, 1..5V
Connection Material  SUS316L/316L VIM/VAR
Diaphragm Material  SUS316L/316L VIM/VAR/V Nickel-based alloy
Stability Performance Typical value: 0.1%FS/Year
Leak Rate ≤ 1 × 10⁻¹⁰kPa. I/s
Packaging Vacuum double-layer packaging, compliant with SEMI E49.6

 

Specification

 

 

 

Electrical connection

 

 

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